Low-energy electron diffraction analysis of the Si(111)7×7...

Low-energy electron diffraction analysis of the Si(111)7×7 structure

Tong, S. Y.
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Volume:
6
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.575179
Date:
May, 1988
File:
PDF, 929 KB
english, 1988
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