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[IEEE 2012 24th International Conference on Microelectronics (ICM) - Algiers, Algeria (2012.12.16-2012.12.20)] 2012 24th International Conference on Microelectronics (ICM) - Image denoising using selective neighboring quaternionic wavelet coefficients

Kadiri, Mohammed, Djebbouri, Mohamed, Carre, Pilippe
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Year:
2012
Language:
english
DOI:
10.1109/icm.2012.6471420
File:
PDF, 475 KB
english, 2012
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