Root-Finding Methods for Assessing SRAM Stability in the...

IEEE Transactions on Semiconductor Manufacturing 2009 / 02 Vol. 22; Iss. 1

Root-Finding Methods for Assessing SRAM Stability in the Presence of Random Dopant Fluctuations

Kanj, Rouwaida, Li, Zhuo, Joshi, Rajiv V., Liu, Frank, Nassif, Sani R.
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Volume:
22
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/tsm.2008.2011662
Date:
February, 2009
File:
PDF, 1.13 MB
english, 2009
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