[IEEE 1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings - Canberra, ACT, Australia (8-11 Dec. 1996)] 1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings - Saturation of effective channel length increase due to hot carrier degradation in submicron LDD nMOSFETs

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