[IEEE 2012 Design, Automation & Test in Europe...

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[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Extending the lifetime of NAND flash memory by salvaging bad blocks

Chundong Wang,, Weng-Fai Wong,
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Year:
2012
Language:
english
DOI:
10.1109/date.2012.6176473
File:
PDF, 196 KB
english, 2012
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