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[IEEE 2004 IEEE Radiation Effects Data Workshop - Atlanta, GA, USA (22 July 2004)] 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) - Angular effects in proton-induced single-event upsets in silicon-on-sapphire and silicon-on-insulator devices
Kniffin, S.D., McCabe, J.F., Gardner, G.A., Lintz, J., Ross, C., Golke, K., Bums, B., Sanders, A.B., Reed, R.A., LaBel, K.A., Marshall, P.W., Liu, S.T., Kim, H.S., Forney, J.D., Tabbert, C.J., Carts,Year:
2004
Language:
english
DOI:
10.1109/redw.2004.1352916
File:
PDF, 803 KB
english, 2004