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Comment on ‘‘Scanned-cantilever atomic force microscope’’ [Rev. Sci. Instrum. 64, 908 (1993)]
Baselt, David R., Baldeschwieler, John D.Volume:
65
Year:
1994
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1144721
File:
PDF, 346 KB
english, 1994