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[IEEE Digests of INTERMAG 2003. International Magnetics Conference - Boston, MA, USA (28 March-3 April 2003)] Digest of INTERMAG 2003. International Magnetics Conference (Cat. No.03CH37401) - Characterization of soft magnetic thin film by means of single sheet testing
De Wulf, M., Dupre, L., te Lintelo, H., Melkebeek, J.Year:
2003
Language:
english
DOI:
10.1109/intmag.2003.1230588
File:
PDF, 63 KB
english, 2003