![](/img/cover-not-exists.png)
[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Impact of Source/Drain contact and gate finger spacing on the RF reliability of 45-nm RF nMOSFETs
Arora, Rajan, Seth, Sachin, Poh, John Chung Hang, Cressler, John D., Sutton, Akil K., Nayfeh, Hasan M., Rosa, Giuseppe L., Freeman, GregYear:
2011
Language:
english
DOI:
10.1109/irps.2011.5784518
File:
PDF, 384 KB
english, 2011