[IEEE 2009 American Control Conference - St. Louis, MO, USA...

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[IEEE 2009 American Control Conference - St. Louis, MO, USA (2009.06.10-2009.06.12)] 2009 American Control Conference - Fast time-frequency domain reflectometry based on the AR coefficient estimation of a chirp signal

Doo, Seung Ho, Ra, Won-Sang, Yoon, Tae Sung, Park, Jin Bae
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Year:
2009
Language:
english
DOI:
10.1109/acc.2009.5160315
File:
PDF, 603 KB
english, 2009
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