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[IEEE 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS) - College Station, TX, USA (2014.8.3-2014.8.6)] 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS) - Analysis of fin height on FinFET SRAM cell hardening
Villacorta, Hector, Segura, Jaume, Bota, Sebastia, Champac, VictorYear:
2014
Language:
english
DOI:
10.1109/mwscas.2014.6908504
File:
PDF, 1.07 MB
english, 2014