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[IEEE 2013 IEEE International Solid-State Circuits Conference (ISSCC 2013) - San Francisco, CA (2013.2.17-2013.2.21)] 2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers - Cycling endurance optimization scheme for 1Mb STT-MRAM in 40nm technology
Hung-Chang Yu,, Kai-Chun Lin,, Ku-Feng Lin,, Chin-Yi Huang,, Yu-Der Chih,, Tong-Chern Ong,, Chang, J., Natarajan, S., Tran, L. C.Year:
2013
Language:
english
DOI:
10.1109/isscc.2013.6487710
File:
PDF, 268 KB
english, 2013