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Electronic structure of silicon nitride studied by both soft x-ray spectroscopy and photoelectron spectroscopy
Sénémaud, C., Driss-Khodja, M., Gheorghiu, A., Harel, S., Dufour, G., Roulet, H.Volume:
74
Year:
1993
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.354286
File:
PDF, 898 KB
english, 1993