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Characterization of processing-induced defects in high-purity InP by photoluminescence
Mayer, K. M., Makita, Y., Yamada, A., Shibata, H., Beye, A. C., Shimada, J.Volume:
72
Year:
1992
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.351783
File:
PDF, 950 KB
english, 1992