Annealing temperature dependence of capacitance-voltage...

Journal of Applied Physics 2006 Vol. 99; Iss. 3

Annealing temperature dependence of capacitance-voltage characteristics in Ge-nanocrystal-based nonvolatile memory structures

Park, C. J., Cho, H. Y., Kim, S., Choi, Suk-Ho, Elliman, R. G., Han, J. H., Kim, Chungwoo, Hwang, H. N., Hwang, C. C.
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Volume:
99
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2168249
File:
PDF, 432 KB
english, 2006
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