Structural characterization of a CuO/MgO artificially superstructured film by the x-ray diffraction method
Sohma, M., Kawaguchi, K., Fujii, Y.Volume:
75
Year:
1994
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.356343
File:
PDF, 738 KB
english, 1994