Extremely scaled high-k/In0.53Ga0.47As gate stacks with low...

Extremely scaled high-k/In0.53Ga0.47As gate stacks with low leakage and low interface trap densities

Chobpattana, Varistha, Mikheev, Evgeny, Zhang, Jack Y., Mates, Thomas E., Stemmer, Susanne
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
116
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4896494
Date:
September, 2014
File:
PDF, 1.73 MB
english, 2014
Conversion to is in progress
Conversion to is failed