Infrared total internal reflection spectroscopy of...

Infrared total internal reflection spectroscopy of dimethylcadmium on silicon

Sanchez, Esaul
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Volume:
6
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.575104
Date:
May, 1988
File:
PDF, 534 KB
english, 1988
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