Oblique grain boundaries: Analysis of light and electron...

Journal of Applied Physics 1988 Vol. 63; Iss. 9

Oblique grain boundaries: Analysis of light and electron beam induced current profiles in silicon

Mittiga, A., Capizzi, M., Coluzza, C., Frova, A., Parisi, V., Cavalcoli, D., Moro, L., Prudenziati, M.
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Volume:
63
Year:
1988
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.340135
File:
PDF, 577 KB
english, 1988
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