Electron holography of Si:C films and Si:C-based devices
Gribelyuk, M. A., Adam, T. N., Ontalus, V., Ronsheim, P. R., Kimball, L., Schonenberg, K. T.Volume:
110
Year:
2011
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3630029
File:
PDF, 1.92 MB
english, 2011