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Thickness dependences of ferroelectric and dielectric properties in (Bi[sub 3.15]Nd[sub 0.85])Ti[sub 3]O[sub 12] thin films
Gao, X. S., Wang, J.Volume:
99
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2185838
File:
PDF, 512 KB
english, 2006