[IEEE 2012 IEEE 12th International Conference on Nanotechnology (IEEE-NANO) - Birmingham, United Kingdom (2012.08.20-2012.08.23)] 2012 12th IEEE International Conference on Nanotechnology (IEEE-NANO) - Characterisation of nanoporous materials using Focused Ion Beam milling method
Sahand Chitsaz Charandabi,, Sabouri, Aydin, Ostadi, Hossein, Anthony, Carl J., Prewett, Philip D.Year:
2012
Language:
english
DOI:
10.1109/nano.2012.6322174
File:
PDF, 1.04 MB
english, 2012