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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Reliability of Ferroelectric Random Access memory embedded within 130nm CMOS
Rodriguez, J., Remack, K., Gertas, J., Wang, L., Zhou, C., Boku, K., Rodriguez-Latorre, J., Udayakumar, K. R., Summerfelt, S., Moise, T., Kim, D., Groat, J., Eliason, J., Depner, M., Chu, F.Year:
2010
Language:
english
DOI:
10.1109/irps.2010.5488738
File:
PDF, 845 KB
english, 2010