[IEEE 2011 IEEE International Ultrasonics Symposium (IUS) - Orlando, FL, USA (2011.10.18-2011.10.21)] 2011 IEEE International Ultrasonics Symposium - Optimized STW devices with buried electrodes based on a mixed FEM/BEM numerical model
Ventura, Pascal, Dufilie, Pierre, Hecht, FredericYear:
2011
Language:
english
DOI:
10.1109/ultsym.2011.0136
File:
PDF, 640 KB
english, 2011