Reflectance difference for in situ control of surface V/III ratio during epitaxial growth of GaAs
Jönsson, J., Paulsson, G., Samuelson, L.Volume:
70
Year:
1991
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.349513
File:
PDF, 935 KB
english, 1991