Evaluation of potential variations around grain boundaries in BaSi2 epitaxial films by Kelvin probe force microscopy
Baba, Masakazu, Tsurekawa, Sadahiro, Watanabe, Kentaro, Du, W., Toko, Kaoru, Hara, Kosuke O., Usami, Noritaka, Sekiguchi, Takashi, Suemasu, TakashiVolume:
103
Year:
2013
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4824335
File:
PDF, 1.06 MB
english, 2013