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[IEEE 2008 15th IEEE International Conference on Image Processing - San Diego, CA, USA (2008.10.12-2008.10.15)] 2008 15th IEEE International Conference on Image Processing - Salient point characterization for low resolution meshes
Walter, Nicolas, Aubreton, Olivier, Laligant, OlivierYear:
2008
Language:
english
DOI:
10.1109/icip.2008.4712054
File:
PDF, 249 KB
english, 2008