Increased ion intensity and reliability of the Stockholm...

Increased ion intensity and reliability of the Stockholm electron beam ion source (abstract)a)

Beebe, E., Liljeby, L., Pikin, A., Björkhage, M., Engström, Å., Paal, A.
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Volume:
65
Year:
1994
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1145035
File:
PDF, 348 KB
english, 1994
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