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Increased ion intensity and reliability of the Stockholm electron beam ion source (abstract)a)
Beebe, E., Liljeby, L., Pikin, A., Björkhage, M., Engström, Å., Paal, A.Volume:
65
Year:
1994
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1145035
File:
PDF, 348 KB
english, 1994