Atomic scale simulation of defect production in irradiated...

Atomic scale simulation of defect production in irradiated 3C-SiC

Devanathan, R., Weber, W. J., Gao, F.
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Volume:
90
Year:
2001
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1389523
File:
PDF, 422 KB
english, 2001
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