[IEEE 2008 Seventh International Conference on Machine Learning and Applications - San Diego, CA, USA (2008.12.11-2008.12.13)] 2008 Seventh International Conference on Machine Learning and Applications - Detection of Sequential Outliers Using a Variable Length Markov Model
Low-Kam, Cécile, Laurent, Anne, Teisseire, MaguelonneYear:
2008
Language:
english
DOI:
10.1109/icmla.2008.137
File:
PDF, 244 KB
english, 2008