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[IEEE 2002 International Microwave Symposium (MTT 2002) - Seattle, WA, USA (2-7 June 2002)] 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278) - Extraction of a polynomial LDMOS model for distortion simulations using small-signal S-parameter measurements
Vuolevi, J., Aikio, J., Rahkonen, T.Volume:
3
Year:
2002
Language:
english
DOI:
10.1109/mwsym.2002.1012298
File:
PDF, 413 KB
english, 2002