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[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - Power Management for Wafer-Level Test During Burn-In
Bahukudumbi, Sudarshan, Chakrabarty, KrishnenduYear:
2008
Language:
english
DOI:
10.1109/ats.2008.26
File:
PDF, 287 KB
english, 2008