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[IEEE 2011 IEEE Custom Integrated Circuits Conference - CICC 2011 - San Jose, CA, USA (2011.09.19-2011.09.21)] 2011 IEEE Custom Integrated Circuits Conference (CICC) - Wafer-specific centering of compact transistor model parameters for advanced technologies and models
De Vries, B., Scholten, A.J., Rommers, P.F.E., Stoutjesdijk, M., Klaassen, D.B.M.Year:
2011
Language:
english
DOI:
10.1109/cicc.2011.6055344
File:
PDF, 968 KB
english, 2011