[IEEE 2010 27th International Conference on...

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[IEEE 2010 27th International Conference on Microelectronics Proceedings - Nis, Serbia (2010.05.16-2010.05.19)] 2010 27th International Conference on Microelectronics Proceedings - Current-Voltage Characteristic of a p-n junction: Problems and solutions

Velazquez-Perez, J. E., Gurevich, Yu. G.
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Year:
2010
Language:
english
DOI:
10.1109/miel.2010.5490525
File:
PDF, 234 KB
english, 2010
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