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Topographic cross talk in reflection mode near-field optical microscopy on patterned structures
Rosenberger, A., Münnemann, A., Kiendl, F., Güntherodt, G., Rosenbusch, P., Bland, J. A. C., Eggers, G., Fumagalli, P.Volume:
89
Year:
2001
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1364642
File:
PDF, 405 KB
english, 2001