Cutoff probe using Fourier analysis for electron density...

Review of Scientific Instruments 2012 Vol. 83; Iss. 1

Cutoff probe using Fourier analysis for electron density measurement

Na, Byung-Keun, You, Kwang-Ho, Kim, Dae-Woong, Chang, Hong-Young, You, Shin-Jae, Kim, Jung-Hyung
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Volume:
83
Year:
2012
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3680103
File:
PDF, 1.33 MB
english, 2012
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