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[IEEE 1989 International Conference on Microelectronic Test Structures - Edinburgh, UK (13-14 March 1989)] Proceedings of the 1989 International Conference on Microelectronic Test Structures - Electrostatic discharge test structures for CMOS circuits
Terletzki, H., Risch, L.Year:
1989
Language:
english
DOI:
10.1109/icmts.1989.39319
File:
PDF, 486 KB
english, 1989