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[IEEE 2010 International Conference on High Voltage Engineering and Application (ICHVE) - New Orleans, LA, USA (2010.10.11-2010.10.14)] 2010 International Conference on High Voltage Engineering and Application - Analysis of infrared spectrum characteristic and variation trend of SF6 PD decomposition

Liu, Fan, Gan, Degang, Zhou, Siyu, Hu, Can, Liu, Ping, Zhang, Xiaoxing
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Year:
2010
Language:
english
DOI:
10.1109/ichve.2010.5640741
File:
PDF, 336 KB
english, 2010
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