Hot carrier effects in AlGaAs/InGaAs high electron mobility...

Journal of Applied Physics 1997 Vol. 82; Iss. 11

Hot carrier effects in AlGaAs/InGaAs high electron mobility transistors: Failure mechanisms induced by hot carrier testing

Meneghesso, Gaudenzio, Mion, Alvise, Haddab, Youcef, Pavesi, Maura, Manfredi, Manfredo, Canali, Claudio, Zanoni, Enrico
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
82
Year:
1997
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.366413
File:
PDF, 437 KB
english, 1997
Conversion to is in progress
Conversion to is failed