Scaling behavior of internal stress in electrodeposited...

Scaling behavior of internal stress in electrodeposited nickel thin films

Saitou, M., Oshiro, S., Sagawa, Y.
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Volume:
104
Year:
2008
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3009336
File:
PDF, 366 KB
english, 2008
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