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Deep-level transient spectroscopy of dislocation-related defects in epitaxial multilayer structures
Thor, E., Mühlberger, M., Palmetshofer, L., Schäffler, F.Volume:
90
Year:
2001
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1389762
File:
PDF, 369 KB
english, 2001