An examination of double positioning boundaries and...

Journal of Applied Physics 1988 Vol. 63; Iss. 8

An examination of double positioning boundaries and interface misfit in beta-SiC films on alpha-SiC substrates

Kong, H. S., Jiang, B. L., Glass, J. T., Rozgonyi, G. A., More, K. L.
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Volume:
63
Year:
1988
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.341004
File:
PDF, 1.09 MB
english, 1988
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