Field Dependence of Charge Yield in Silicon Dioxide

IEEE Transactions on Nuclear Science 2014 / 12 Vol. 61; Iss. 6

Field Dependence of Charge Yield in Silicon Dioxide

Johnston, A. H., Swimm, R. T., Thorbourn, D. O., Adell, P. C., Rax, B. G.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
61
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2014.2367512
Date:
December, 2014
File:
PDF, 754 KB
english, 2014
Conversion to is in progress
Conversion to is failed