Experimental Characterization and Simulation of...

IEEE Transactions on Nuclear Science 2014 / 12 Vol. 61; Iss. 6

Experimental Characterization and Simulation of Electron-Induced SEU in 45-nm CMOS Technology

Samaras, A., Pourrouquet, P., Sukhaseum, N., Gouyet, L., Vandevelde, B., Chatry, N., Ecoffet, R., Bezerra, F., Lorfevre, E.
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2014.2367544
Date:
December, 2014
File:
PDF, 875 KB
english, 2014
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