[IEEE 2007 9th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2007) - Deauville, France (2007.09.10-2007.09.14)] 2007 9th European Conference on Radiation and Its Effects on Components and Systems - SEB characterisation of commercial power MOSFETs with backside laser and heavy ions of different ranges
Luu, A., Miller, F., Poirot, P., Gaillard, R., Buard, N., Carriere, T., Austin, P., Bafleur, M., Sarrabayrouse, G.Year:
2007
Language:
english
DOI:
10.1109/radecs.2007.5205543
File:
PDF, 4.87 MB
english, 2007