Characterization of GaAs[sub 1−x]N[sub x] epitaxial layers...

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 2004 Vol. 22; Iss. 3

Characterization of GaAs[sub 1−x]N[sub x] epitaxial layers by ion beam analysis

Wei, P., Chicoine, M., Gujrathi, S., Schiettekatte, F., Beaudry, J.-N., Masut, R. A., Desjardins, P.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
22
Year:
2004
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.1648671
File:
PDF, 337 KB
english, 2004
Conversion to is in progress
Conversion to is failed