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[IEEE 2002 International Microwave Symposium (MTT 2002) - Seattle, WA, USA (2-7 June 2002)] 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278) - Repeat measurements and metrics for nonlinear model development
Remley, K.A., Jargon, J.A., Schreurs, D., DeGroot, D.C., Gupta, K.C.Volume:
3
Year:
2002
Language:
english
DOI:
10.1109/mwsym.2002.1012301
File:
PDF, 386 KB
english, 2002