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[IEEE 2010 IEEE Custom Integrated Circuits Conference -CICC 2010 - San Jose, CA, USA (2010.09.19-2010.09.22)] IEEE Custom Integrated Circuits Conference 2010 - Digital phase tightening for millimeter-wave imaging

Nguyen, Khoa M., Accardi, Anthony, Kim, Helen, Wornell, Gregory W., Sodini, Charles G.
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Year:
2010
Language:
english
DOI:
10.1109/cicc.2010.5617389
File:
PDF, 160 KB
english, 2010
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