Depth analysis of boron diffusion in MgO/CoFeB bilayer by...

Journal of Applied Physics 2010 Vol. 108; Iss. 4

Depth analysis of boron diffusion in MgO/CoFeB bilayer by x-ray photoelectron spectroscopy

Lu, Y., Lépine, B., Jézéquel, G., Ababou, S., Alnot, M., Lambert, J., Renard, A., Mullet, M., Deranlot, C., Jaffrès, H., Petroff, F., George, J.-M.
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Volume:
108
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3465308
File:
PDF, 811 KB
english, 2010
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