[IRE 1984 International Electron Devices Meeting - ()] 1984 International Electron Devices Meeting - Process considerations in restructurable VLSI for wafer-scale integration
Wyatt, P.W., Raffel, J.I., Chapman, G.H., Mathur, B., Burns, J.A., Herndon, T.O.Year:
1984
Language:
english
DOI:
10.1109/iedm.1984.190800
File:
PDF, 459 KB
english, 1984